Imitation Learning for Simultaneous Escape Routing

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dc.contributor.authorKim, Minsuko
dc.contributor.authorKim, Jounghoko
dc.contributor.authorPark, Hyunwookko
dc.contributor.authorSon, Keeyoungko
dc.contributor.authorKim, SeongGukko
dc.contributor.authorKim, Haeyeonko
dc.contributor.authorSong, Jinwookko
dc.date.accessioned2023-02-02T06:00:53Z-
dc.date.available2023-02-02T06:00:53Z-
dc.date.created2023-01-25-
dc.date.issued2021-10-17-
dc.identifier.citation30th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2021-
dc.identifier.issn2165-4107-
dc.identifier.urihttp://hdl.handle.net/10203/304943-
dc.description.abstractThis paper proposes a novel problem-solving strategy for simultaneous escape routing (SER) by imitation learning (IL) which is beneficial to exclude human experts' domain knowledge for designing heuristic solvers. The SER is a crucial task for printed circuit boards (PCB) layout design, affecting signal integrity (SI). However, SER is NP-hard, heuristic solver that provides a fair solution in a reasonable time is needed. We utilize deep neural network (DNN) as a learn-able heuristic solver trained by IL. To be specific, a simple search-based expert policy generates a guiding solution; the DNN learns to imitate the guiding solution. Extensive experiments show that the proposed method significantly outperforms baseline SER methods, including genetic algorithm (GA).-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleImitation Learning for Simultaneous Escape Routing-
dc.typeConference-
dc.identifier.wosid000758515900016-
dc.identifier.scopusid2-s2.0-85123162272-
dc.type.rimsCONF-
dc.citation.publicationname30th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2021-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationAustin-
dc.identifier.doi10.1109/EPEPS51341.2021.9609145-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorKim, Minsu-
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EE-Conference Papers(학술회의논문)
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