Single-shot full-field nano-scale topography measurement using spectrally multiplexed Kramers–Kronig holographic imaging

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dc.contributor.authorLee, ChungHako
dc.contributor.authorPark, Yong Keunko
dc.contributor.authorBaek, Yoonseokko
dc.contributor.authorHugonnet, Herve Jeromeko
dc.date.accessioned2023-01-11T01:02:10Z-
dc.date.available2023-01-11T01:02:10Z-
dc.date.created2023-01-05-
dc.date.created2023-01-05-
dc.date.issued2022-07-08-
dc.identifier.citationNANO KOREA 2022 Symposium-
dc.identifier.urihttp://hdl.handle.net/10203/304185-
dc.languageEnglish-
dc.publisherMinistry of Science and ICT-
dc.titleSingle-shot full-field nano-scale topography measurement using spectrally multiplexed Kramers–Kronig holographic imaging-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameNANO KOREA 2022 Symposium-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationKintex, Iisan-
dc.contributor.localauthorPark, Yong Keun-
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PH-Conference Papers(학술회의논문)
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