Complementary metal oxide semiconductor image sensor and method for fabricating the sameCMOS 이미지센서 및 이의 제조방법

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 75
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorChoi, Yang-Kyuko
dc.contributor.authorKim, Kuk-hwanko
dc.date.accessioned2022-12-26T03:00:44Z-
dc.date.available2022-12-26T03:00:44Z-
dc.identifier.urihttp://hdl.handle.net/10203/303690-
dc.description.abstractProvided are a CMOS image sensor and a method for fabricating the same. The image sensor comprises a light receiving element, and a nanopillar formed at an upper end of the light receiving element. A method for fabricating a CMOS image sensor, the method comprising steps of: inducing a plasma discharge and forming nanodusts in a light receiving region; etching the light receiving region using the nanodusts as a mask; and removing the nanodusts.-
dc.titleComplementary metal oxide semiconductor image sensor and method for fabricating the same-
dc.title.alternativeCMOS 이미지센서 및 이의 제조방법-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.contributor.nonIdAuthorKim, Kuk-hwan-
dc.contributor.assignee한국과학기술원-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber200610168097.2-
dc.identifier.patentRegistrationNumber001996605-
dc.date.application2006-12-25-
dc.date.registration2010-05-19-
dc.publisher.countryCC-
Appears in Collection
EE-Patent(특허)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0