An Accurate and Simple Method for Measurement of RF Characterization in Thin Substrate

Abstract

This paper presents that dielectric constant and loss tangent can be obtained using only two different microstrip lines in a measurement environment despite the thin substrate. It is impossible to calculate the conductor loss and radiation loss exactly only using theory. Therefore, in this paper, using 3-D electromagnetic solver CST Microwave Studio (MWS), the conductor loss was obtained and radiation loss was neglected. As result, in this paper, the dielectric constant has errors of 0.53% and 1.46%, in simulation and measurement each.