Dielectric Engineering for Enhanced Top gate Monolayer MoS2 Transistor Using iCVD-based High-k Dielectric

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dc.contributor.authorPark, Seo Hakko
dc.contributor.authorLee, Sanghunko
dc.contributor.authorChoi, Sung-Yoolko
dc.date.accessioned2022-11-29T05:01:18Z-
dc.date.available2022-11-29T05:01:18Z-
dc.date.created2022-11-27-
dc.date.issued2022-07-05-
dc.identifier.citationGraphene 2022-
dc.identifier.urihttp://hdl.handle.net/10203/301226-
dc.languageEnglish-
dc.publisherPhantoms Foundation-
dc.titleDielectric Engineering for Enhanced Top gate Monolayer MoS2 Transistor Using iCVD-based High-k Dielectric-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameGraphene 2022-
dc.identifier.conferencecountryGE-
dc.identifier.conferencelocationEurogress Aachen-
dc.contributor.localauthorChoi, Sung-Yool-
dc.contributor.nonIdAuthorPark, Seo Hak-
dc.contributor.nonIdAuthorLee, Sanghun-
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EE-Conference Papers(학술회의논문)
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