Photonically integrated spectroscopy platform using grating-to-grating coupling (Conference Presentation)

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dc.contributor.authorBopp, Dougko
dc.contributor.authorKang, Songbaiko
dc.contributor.authorHummon, Matthew T.ko
dc.contributor.authorKitching, John E.ko
dc.contributor.authorAksyuk, Vladimir A.ko
dc.contributor.authorSrinivasan, Kartik A.ko
dc.contributor.authorKim, Sangsikko
dc.contributor.authorWestly, Daron A.ko
dc.date.accessioned2022-11-25T03:02:22Z-
dc.date.available2022-11-25T03:02:22Z-
dc.date.created2022-11-18-
dc.date.issued2018-03-14-
dc.identifier.citationSteep Dispersion Engineering and Opto-Atomic Precision Metrology XI-
dc.identifier.urihttp://hdl.handle.net/10203/300980-
dc.description.abstractIn the pursuit of developing a portable wavelength reference, a photonically integrated chip (PIC) was developed to perform high resolution spectroscopy in a small package. The PIC outcouples light from one grating into free space where it is reflected and directed into an adjacent grating that couples into a separate waveguide. These gratings are extreme-mode-converters which convert the confined mode with a characteristic mode size of less than a micron to a collimated 100 micron diameter beam in order to mitigate transit time broadening for high resolution spectroscopy as well as reduce the diffraction angle. A miniature atomic vapor cell is inserted in the path of the beam to complete the spectroscopic platform. Preliminary results demonstrate sub-Doppler features. Coupling into the chip is achieved using fiber arrays enabling the spectroscopic signal to be routed back through an optical fiber and monitored. A laser is then locked to these sub-Doppler features completing an integrated wavelength reference. Analysis of the atom-light interactions made available by this platform will be discussed with an emphasis on the application of such structures to portable wavelength metrology.-
dc.languageEnglish-
dc.publisherSPIE-
dc.titlePhotonically integrated spectroscopy platform using grating-to-grating coupling (Conference Presentation)-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameSteep Dispersion Engineering and Opto-Atomic Precision Metrology XI-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Francisco, United States-
dc.identifier.doi10.1117/12.2298114-
dc.contributor.localauthorKim, Sangsik-
dc.contributor.nonIdAuthorBopp, Doug-
dc.contributor.nonIdAuthorKang, Songbai-
dc.contributor.nonIdAuthorHummon, Matthew T.-
dc.contributor.nonIdAuthorKitching, John E.-
dc.contributor.nonIdAuthorAksyuk, Vladimir A.-
dc.contributor.nonIdAuthorSrinivasan, Kartik A.-
dc.contributor.nonIdAuthorWestly, Daron A.-
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EE-Conference Papers(학술회의논문)
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