On-site Noise Exposure technique for noise-robust machine fault classification

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dc.contributor.authorYi, Wonjunko
dc.contributor.authorChoi, Jung-Wooko
dc.date.accessioned2022-11-01T13:00:32Z-
dc.date.available2022-11-01T13:00:32Z-
dc.date.created2022-10-28-
dc.date.issued2022-10-25-
dc.identifier.citation24th International Congress on Acoustics, ICA 2022-
dc.identifier.urihttp://hdl.handle.net/10203/299224-
dc.description.abstractIn-situ classification of faulty sounds is an important issue in machine health monitoring and diagnosis. However, in a noisy environment such as a factory, machine sound is always mixed up with environmental noises, and noise-only periods can exist when a machine is not in operation. Therefore, a deep neural network (DNN)-based fault classifier has to be able to distinguish noise from machine sound and be robust to mixed noises. To deal with these problems, we investigate on-site noise exposure (ONE) that exposes a DNN model to the noises recorded in the same environment where the machine operates. Like the outlier exposure technique, noise exposure trains a DNN classifier to produce a uniform predicted probability distribution against noise-only data. During inference, the DNN classifier trained by ONE outputs the maximum softmax probability as the noise score and determines the noise-only period. We mix machine sound and noises of the ToyADMOS2 dataset to simulate highly noisy data. A ResNet-based classifier trained by ONE is evaluated and compared with those trained by other out-of-distribution detection techniques. The test results show that exposing a model to on-site noises can make a model more robust than using other noises or detection techniques.-
dc.languageEnglish-
dc.publisherInternational Commission for Acoustics-
dc.titleOn-site Noise Exposure technique for noise-robust machine fault classification-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname24th International Congress on Acoustics, ICA 2022-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationHwabaek International Convention Center-
dc.contributor.localauthorChoi, Jung-Woo-
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EE-Conference Papers(학술회의논문)
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