Addressing the detrimental effect of CeO2 radical scavenger on the durability of polymer electrolyte membrane fuel cells

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dc.contributor.authorYuk, Seongminko
dc.contributor.authorJung, Jinkwanko
dc.contributor.authorSong, Kah-Youngko
dc.contributor.authorLee, Dong Wookko
dc.contributor.authorLee, Dong-Hyunko
dc.contributor.authorChoi, Sungyuko
dc.contributor.authorDoo, Gisuko
dc.contributor.authorHyun, Jonghyunko
dc.contributor.authorKwen, Jiyunko
dc.contributor.authorKim, Jun Youngko
dc.contributor.authorKim, Hee-Takko
dc.date.accessioned2022-10-25T09:00:31Z-
dc.date.available2022-10-25T09:00:31Z-
dc.date.created2022-10-25-
dc.date.issued2023-01-
dc.identifier.citationCHEMICAL ENGINEERING JOURNAL, v.452-
dc.identifier.issn1385-8947-
dc.identifier.urihttp://hdl.handle.net/10203/299096-
dc.description.abstractA radical scavenger, CeO2, effectively improves the chemical durability of fuel cell membranes, however, Ce4+ ions eluted from the CeO2 lead to Pt/C degradation and diminished power performance. To address the detri-mental effect, we prepared a carbon nitride (C2N) coating on CeO2 nanoparticles. The C2N protective layer reduced the Ce4+ dissolution rate 11-fold compared with pristine CeO2. Density functional theory calculations suggest that the C2N structure suppresses Ce4+ dissolution by strongly binding the Ce4+. Furthermore, it has a profoundly lowered band gap in contact with CeO2, enabling C2N-mediated electron transfer for efficient radical scavenging reaction. A membrane electrode assembly fabricated using the C2N-coated CeO2 exhibited excellent open circuit voltage durability for more than 600 h, without any loss in power performance. The judicious surface engineering of CeO2 avoids the deep-rooted trade-off between membrane and catalyst layer durability.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.titleAddressing the detrimental effect of CeO2 radical scavenger on the durability of polymer electrolyte membrane fuel cells-
dc.typeArticle-
dc.identifier.wosid000868156400001-
dc.identifier.scopusid2-s2.0-85137778068-
dc.type.rimsART-
dc.citation.volume452-
dc.citation.publicationnameCHEMICAL ENGINEERING JOURNAL-
dc.identifier.doi10.1016/j.cej.2022.139061-
dc.contributor.localauthorKim, Hee-Tak-
dc.contributor.nonIdAuthorSong, Kah-Young-
dc.contributor.nonIdAuthorKwen, Jiyun-
dc.contributor.nonIdAuthorKim, Jun Young-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorC2N protective layer-
dc.subject.keywordAuthorCeO2 radical scavenger-
dc.subject.keywordAuthorC2N-mediated electron transfer-
dc.subject.keywordPlusCHEMICAL DEGRADATION-
dc.subject.keywordPlusCERIUM-
dc.subject.keywordPlusPLATINUM-
dc.subject.keywordPlusDISSOLUTION-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusMITIGATION-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusREDUCTION-
dc.subject.keywordPlusMECHANISM-
dc.subject.keywordPlusMIGRATION-
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