METHOD OF INSPECTING STRUCTURE AND INSPECTION SYSTEM구조물의 진단 방법 및 진단 시스템

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dc.contributor.authorSohn, Hoonko
dc.contributor.authorLiu, Peipeiko
dc.contributor.authorJang, Jin-Hoko
dc.date.accessioned2022-05-31T01:00:21Z-
dc.date.available2022-05-31T01:00:21Z-
dc.identifier.urihttp://hdl.handle.net/10203/296735-
dc.description.abstractIn a method of inspecting a structure, a first ultrasonic signal generated by a first laser beam from a target structure is received. Generating the first ultrasonic signal by providing the first laser beam generated from a first excitation unit to the target structure. A second ultrasonic signal generated from the target structure by a second laser beam different from the first laser beam is received. Generating the second ultrasonic signal by providing the second laser beam generated from a second excitation unit to the target structure. Receiving a third ultrasonic signal, the third ultrasonic signal generated from the target structure by the first laser beam and the second laser beam. Generating the third ultrasonic signal by simultaneously providing the first and second laser beams to the target structure. Determining whether the target structure is damaged based on a first ultrasonic spectrum, a second ultrasonic spectrum, and a third ultrasonic spectrum, the first ultrasonic spectrum, the second ultrasonic spectrum, and the third ultrasonic spectrum being obtained by converting the first ultrasonic signal, the second ultrasonic signal, and the third ultrasonic signal, respectively.-
dc.titleMETHOD OF INSPECTING STRUCTURE AND INSPECTION SYSTEM-
dc.title.alternative구조물의 진단 방법 및 진단 시스템-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthorSohn, Hoon-
dc.contributor.nonIdAuthorJang, Jin-Ho-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber201910595014.5-
dc.identifier.patentRegistrationNumber110672717-
dc.date.application2019-07-03-
dc.date.registration2022-05-17-
dc.publisher.countryCC-
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CE-Patent(특허)
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