A 36.2 dB High SNR and PVT/Leakage-Robust eDRAM Computing-In-Memory Macro With Segmented BL and Reference Cell Array

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dc.contributor.authorHa, Sangwooko
dc.contributor.authorKim, Sangjinko
dc.contributor.authorHan, Donghyeonko
dc.contributor.authorUm, Soyeonko
dc.contributor.authorYoo, Hoi-Junko
dc.date.accessioned2022-05-16T09:00:48Z-
dc.date.available2022-05-16T09:00:48Z-
dc.date.created2022-05-16-
dc.date.created2022-05-16-
dc.date.issued2022-05-
dc.identifier.citationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.69, no.5, pp.2433 - 2437-
dc.identifier.issn1549-7747-
dc.identifier.urihttp://hdl.handle.net/10203/296552-
dc.description.abstractComputing-in-memory (CIM) shows high energy-efficiency through the analog DNN computation inside the memory macros. However, as the DNN size increases, the energy-efficiency of CIM is reduced by external memory access (EMA). One of the promising solutions is eDRAM based CIM to increase memory capacity with a high density cell. Although the eDRAM-CIM has a higher density than the SRAM-CIM, it suffers from both poor robustness and a low signal-to-noise ratio (SNR). In this brief, the energy-efficient eDRAM-CIM macro is proposed while improving computational robustness and SNR with three key features: 1) High SNR voltage-based accumulation with segmented BL architecture (SBLA), resulting in 17.1 dB higher SNR, 2) canceling PVT/leakage-induced error with common-mode error canceling (CMEC) circuit, resulting in 51.4% PVT variation reduction and 51.4% refresh power reduction, 3) a ReLU-based zero-gating ADC (ZG-ADC), resulting in ADC power reduction up to 58.1%. According to these new features, the proposed eDRAM-CIM macro achieves 81.5-to-115.0 TOPS/W energy-efficiency with 209-to-295 mu W power consumption when 4b x 4b MAC operation is performed with 250 MHz core frequency. The proposed macro also achieves 91.52% accuracy at the CIFAR-10 object classification dataset (ResNet-20) without accuracy drop even with PVT variation.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA 36.2 dB High SNR and PVT/Leakage-Robust eDRAM Computing-In-Memory Macro With Segmented BL and Reference Cell Array-
dc.typeArticle-
dc.identifier.wosid000790814000013-
dc.identifier.scopusid2-s2.0-85126526096-
dc.type.rimsART-
dc.citation.volume69-
dc.citation.issue5-
dc.citation.beginningpage2433-
dc.citation.endingpage2437-
dc.citation.publicationnameIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS-
dc.identifier.doi10.1109/TCSII.2022.3159808-
dc.contributor.localauthorYoo, Hoi-Jun-
dc.contributor.nonIdAuthorHa, Sangwoo-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorCell leakage-robust-
dc.subject.keywordAuthorcomputing-in-memory (CIM)-
dc.subject.keywordAuthorembedded DRAM-
dc.subject.keywordAuthorerror canceling-
dc.subject.keywordAuthorhigh SNR-
dc.subject.keywordAuthorPVT-robust-
dc.subject.keywordAuthorzero-gating-
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