Automated mutation-adequate test generation for function block diagram programsFunction block diagram 프로그램에 대한 뮤테이션 기반 자동 테스트 생성

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Function block diagram (FBD) is a standard programming language for programmable logic controllers (PLCs). PLCs have been widely used to develop safety-critical systems such as nuclear reactor protection systems. It is crucial to test FBD programs for such systems effectively. Research mainly focused on automated FBD test generation to achieve certain structural coverage criteria. Tests achieving a high coverage level can detect errors but fail to provide the assurance of fault detection. Mutation testing is an error-based testing technique to detect specific types of errors. To give some assurance of fault detection, this paper presents an automated test sequence generation approach using mutation testing techniques for FBD programs and the developed tool, MuFBDTester. MuFBDTester translates the given program and mutants into the input language of a satisfiability modulo theories (SMT) solver to derive a set of test sequences. The primary objective is to find the test data that can distinguish between the results of the given program and mutants. We conducted experiments with several examples including real industrial cases to evaluate the effectiveness and efficiency of our approach. The results indicate that the mutation-based test suites identified a tremendously high percentage of the artificial faults, including the faults that test suites generated to meet coverage criteria could not identify. The test suite generation time of MuFBDTester was significantly reduced compared to manual generation. When compared to coverage-based test generation time, it was sometimes longer, but reasonable considering its better fault detection effectiveness. MuFBDTester can provide highly effective test suites for FBD engineers.
Advisors
Bae, Doo-Hwanresearcher배두환researcher
Description
한국과학기술원 :전산학부,
Publisher
한국과학기술원
Issue Date
2021
Identifier
325007
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전산학부, 2021.8,[iv, 37 p. :]

Keywords

Function block diagram▼aAutomated test generation▼aMutation adequacy▼aMutation testing▼aSMT solver; 기능 블록 다이어그램▼a자동 테스트 생성▼a뮤테이션 충분성 만족▼a뮤테이션 테스팅▼aSMT 해결기

URI
http://hdl.handle.net/10203/296121
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=963357&flag=dissertation
Appears in Collection
CS-Theses_Master(석사논문)
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