Electrical characterization of wafer-bonded interfaces of p+InGaAs/n+InGaAs and p+GaAs/n+InGaAs

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dc.contributor.authorGeum, Dae-Myeongko
dc.contributor.authorKim, Seongkwangko
dc.contributor.authorLim, Hyeongrakko
dc.contributor.authorPark, Juhyukko
dc.contributor.authorJeong, Jaeyongko
dc.contributor.authorHan, JaeHoonko
dc.contributor.authorChoi, WonJunko
dc.contributor.authorKim, Hyojinko
dc.contributor.authorKim, Sanghyeonko
dc.date.accessioned2022-01-05T06:46:42Z-
dc.date.available2022-01-05T06:46:42Z-
dc.date.created2021-11-25-
dc.date.issued2021-07-07-
dc.identifier.citationGlobal Photovoltaic Conference 2021-
dc.identifier.urihttp://hdl.handle.net/10203/291592-
dc.languageEnglish-
dc.publisherKorea Photovoltaic Society (KPVS)-
dc.titleElectrical characterization of wafer-bonded interfaces of p+InGaAs/n+InGaAs and p+GaAs/n+InGaAs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameGlobal Photovoltaic Conference 2021-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationKimdaejung Convention Center, Gwangju-
dc.contributor.localauthorKim, Sanghyeon-
dc.contributor.nonIdAuthorGeum, Dae-Myeong-
dc.contributor.nonIdAuthorHan, JaeHoon-
dc.contributor.nonIdAuthorChoi, WonJun-
dc.contributor.nonIdAuthorKim, Hyojin-
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EE-Conference Papers(학술회의논문)
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