Bayesian optimization of 3-nm node nanosheet FETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, BOKYEOM | ko |
| dc.contributor.author | Shin, Mincheol | ko |
| dc.date.accessioned | 2021-12-07T06:53:28Z | - |
| dc.date.available | 2021-12-07T06:53:28Z | - |
| dc.date.created | 2021-12-01 | - |
| dc.date.issued | 2021-07-07 | - |
| dc.identifier.citation | NANO KOREA 2021 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/290184 | - |
| dc.language | English | - |
| dc.publisher | NANO KOREA | - |
| dc.title | Bayesian optimization of 3-nm node nanosheet FETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | NANO KOREA 2021 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | KINTEX | - |
| dc.contributor.localauthor | Shin, Mincheol | - |
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