Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models

Cited 12 time in webofscience Cited 0 time in scopus
  • Hit : 98
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorKim, Seahko
dc.contributor.authorYoo, Shinko
dc.date.accessioned2021-11-03T06:48:01Z-
dc.date.available2021-11-03T06:48:01Z-
dc.date.created2021-10-26-
dc.date.created2021-10-26-
dc.date.created2021-10-26-
dc.date.issued2021-05-21-
dc.identifier.citation2nd IEEE/ACM International Conference on Automation of Software Test (AST), pp.80 - 89-
dc.identifier.urihttp://hdl.handle.net/10203/288659-
dc.description.abstractAs Deep Neural Networks (DNNs) are rapidly adopted in various domains, many test adequacy metrics for DNN inputs have been introduced to help evaluating, and validating, trained DNN models. Surprise Adequacy (SA) is one such metric that aims to quantitatively measure how surprising a new input is with respect to the data used to train the given model. While SA has been shown to be effective for computer vision tasks such as image classification or object segmentation, its efficacy for DNN based Natural Language Processing has not been thoroughly studied. This paper evaluates whether it is feasible to apply SA analysis to DNN models trained for NLP tasks. We also show that the input distribution captured in the latent embedding space can be multimodal(1) for some NLP tasks, unlike those observed in computer vision tasks, and investigate if catering for the multimodal property of NLP models can improve SA analysis. An empirical evaluation of extended SA metrics with three NLP tasks and nine DNN models shows that, while unimodal SAs perform sufficiently well for text classification, multimodal SA can outperform unimodal metrics.-
dc.languageEnglish-
dc.publisherIEEE COMPUTER SOC-
dc.titleMultimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models-
dc.typeConference-
dc.identifier.wosid000695707800009-
dc.identifier.scopusid2-s2.0-85113734208-
dc.type.rimsCONF-
dc.citation.beginningpage80-
dc.citation.endingpage89-
dc.citation.publicationname2nd IEEE/ACM International Conference on Automation of Software Test (AST)-
dc.identifier.conferencecountrySP-
dc.identifier.conferencelocationMadrid-
dc.identifier.doi10.1109/AST52587.2021.00017-
dc.contributor.localauthorYoo, Shin-
dc.contributor.nonIdAuthorKim, Seah-
Appears in Collection
CS-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 12 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0