학위논문(박사) - 한국과학기술원 : 화학공학과, 2000.2, [ 133 p. ]
Point defect; Czochralski process; Silicon single crystal; Cusp magnetic field; 커스프 자기장; 점 결함; 초크랄스키 공정; 실리콘 단결정
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.