DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Junghwan | ko |
dc.contributor.author | Choi, Yong Suk | ko |
dc.contributor.author | Kim, Junhyuck | ko |
dc.contributor.author | Lee, Jeongmook | ko |
dc.contributor.author | Kim, Tae Jun | ko |
dc.contributor.author | Youn, Young-Sang | ko |
dc.contributor.author | Lim, Sang Ho | ko |
dc.contributor.author | Kim, Jong-Yun | ko |
dc.date.accessioned | 2021-05-12T02:50:12Z | - |
dc.date.available | 2021-05-12T02:50:12Z | - |
dc.date.created | 2021-05-11 | - |
dc.date.created | 2021-05-11 | - |
dc.date.created | 2021-05-11 | - |
dc.date.issued | 2021-04 | - |
dc.identifier.citation | NUCLEAR ENGINEERING AND TECHNOLOGY, v.53, no.4, pp.1297 - 1303 | - |
dc.identifier.issn | 1738-5733 | - |
dc.identifier.uri | http://hdl.handle.net/10203/283656 | - |
dc.description.abstract | Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R-2 = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0-0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1-5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments. (C) 2020 Korean Nuclear Society, Published by Elsevier Korea LLC. | - |
dc.language | English | - |
dc.publisher | KOREAN NUCLEAR SOC | - |
dc.title | Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement | - |
dc.type | Article | - |
dc.identifier.wosid | 000635645000001 | - |
dc.identifier.scopusid | 2-s2.0-85092242900 | - |
dc.type.rims | ART | - |
dc.citation.volume | 53 | - |
dc.citation.issue | 4 | - |
dc.citation.beginningpage | 1297 | - |
dc.citation.endingpage | 1303 | - |
dc.citation.publicationname | NUCLEAR ENGINEERING AND TECHNOLOGY | - |
dc.identifier.doi | 10.1016/j.net.2020.09.018 | - |
dc.contributor.localauthor | Park, Junghwan | - |
dc.contributor.nonIdAuthor | Choi, Yong Suk | - |
dc.contributor.nonIdAuthor | Kim, Junhyuck | - |
dc.contributor.nonIdAuthor | Lee, Jeongmook | - |
dc.contributor.nonIdAuthor | Kim, Tae Jun | - |
dc.contributor.nonIdAuthor | Youn, Young-Sang | - |
dc.contributor.nonIdAuthor | Lim, Sang Ho | - |
dc.contributor.nonIdAuthor | Kim, Jong-Yun | - |
dc.description.isOpenAccess | Y | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Organic film | - |
dc.subject.keywordAuthor | X-ray fluorescence | - |
dc.subject.keywordAuthor | Compton scattering | - |
dc.subject.keywordAuthor | X-ray radiation | - |
dc.subject.keywordAuthor | Thickness | - |
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