DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Chang-Soo | ko |
dc.contributor.author | Kim, Junyoung | ko |
dc.contributor.author | Yoo, Hongki | ko |
dc.date.accessioned | 2021-03-29T05:30:19Z | - |
dc.date.available | 2021-03-29T05:30:19Z | - |
dc.date.created | 2021-03-21 | - |
dc.date.created | 2021-03-21 | - |
dc.date.issued | 2021-02 | - |
dc.identifier.citation | OPTICS EXPRESS, v.29, no.5, pp.6509 - 6522 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | http://hdl.handle.net/10203/282156 | - |
dc.description.abstract | Reflectance confocal microscopy is widely used for non-destructive optical three-dimensional (3D) imaging. In confocal microscopy, a stack of sequential two-dimensional (2D) images with respect to the axial position is typically needed to reconstruct a 3D image. As a result, in conventional confocal microscopy, acquisition speed is often limited by the rate of mechanical scanning in both the transverse and axial directions. We previously reported a high-speed parallel confocal detection method using a pinhole array for color 3D imaging without any mechanical scanners. Here, we report a high-speed color 3D imaging method based on patterned illumination employing a negative pinhole array, whose optical characteristics are the reverse of the conventional pinhole array for transmitting light. The negative pinhole array solves the inherent limitation of a conventional pinhole array, i.e., low transmittance, meaning brighter color images with abundant color information can be acquired. We also propose a 3D image processing algorithm based on the 2D cross-correlation between the acquired image and filtering masks, to produce an axial response. By using four-different filtering masks, we were able to increase the sampling points in calculation of height and enhance the lateral resolution of the color acquisition by a factor of four. The feasibility of high-speed non-contact color 3D measurement with the improved lateral resolution and brightness provided by the negative pinhole array was demonstrated by imaging various specimens. We anticipate that this high-speed color 3D measurement technology with negative pinhole array will be a useful tool in a variety of fields where rapid and accurate non-contact measurement are required, such as industrial inspection and dental scanning. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement | - |
dc.language | English | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.title | Color three-dimensional imaging based on patterned illumination using a negative pinhole array | - |
dc.type | Article | - |
dc.identifier.wosid | 000624968100017 | - |
dc.identifier.scopusid | 2-s2.0-85101354348 | - |
dc.type.rims | ART | - |
dc.citation.volume | 29 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 6509 | - |
dc.citation.endingpage | 6522 | - |
dc.citation.publicationname | OPTICS EXPRESS | - |
dc.identifier.doi | 10.1364/oe.416999 | - |
dc.contributor.localauthor | Yoo, Hongki | - |
dc.contributor.nonIdAuthor | Kim, Chang-Soo | - |
dc.contributor.nonIdAuthor | Kim, Junyoung | - |
dc.description.isOpenAccess | Y | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | STRUCTURED-LIGHT | - |
dc.subject.keywordPlus | SURFACE MEASUREMENT | - |
dc.subject.keywordPlus | CONFOCAL MICROSCOPY | - |
dc.subject.keywordPlus | SHAPE MEASUREMENT | - |
dc.subject.keywordPlus | PROJECTION | - |
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