Low-energy electron point source microscope with position-sensitive electron energy analyzer

Cited 10 time in webofscience Cited 10 time in scopus
  • Hit : 138
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorPark, JYko
dc.contributor.authorKim, SHko
dc.contributor.authorSuh, YDko
dc.contributor.authorPark, WGko
dc.contributor.authorKuk, Yko
dc.date.accessioned2021-03-15T08:50:04Z-
dc.date.available2021-03-15T08:50:04Z-
dc.date.created2020-12-27-
dc.date.issued1999-11-
dc.identifier.citationReview of Scientific Instruments, v.70, no.11, pp.4304 - 4307-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/10203/281548-
dc.description.abstractA low-energy electron point source microscope equipped with a position-sensitive energy analyzer is constructed. A nanometer-sized feature can be zoomed in and its energy-loss spectrum can be measured with a retarding field-type energy analyzer mounted in front of the imaging screen. The geometric and the electronic structures of carbon nanotubes are measured with the present system. Interference between the scattered and the transmitted electron beams through the carbon nanotubes is observed using an atomically sharp field emitter. The electron energy-loss spectrum shows two prominent peaks at similar to 7 and 16-17 eV, which are identified as the pi plasmon and (pi + sigma) surface-plasmon peaks. This result is consistent with the measurements of high-energy electron energy-loss spectroscopy as well as the theoretical calculation. (C) 1999 American Institute of Physics. [S0034-6748(99)02011-0].-
dc.languageEnglish-
dc.publisherAmerican Institute of Physics-
dc.titleLow-energy electron point source microscope with position-sensitive electron energy analyzer-
dc.typeArticle-
dc.identifier.wosid000083452100029-
dc.identifier.scopusid2-s2.0-0008600417-
dc.type.rimsART-
dc.citation.volume70-
dc.citation.issue11-
dc.citation.beginningpage4304-
dc.citation.endingpage4307-
dc.citation.publicationnameReview of Scientific Instruments-
dc.identifier.doi10.1063/1.1150070-
dc.contributor.localauthorPark, JY-
dc.contributor.nonIdAuthorKim, SH-
dc.contributor.nonIdAuthorSuh, YD-
dc.contributor.nonIdAuthorPark, WG-
dc.contributor.nonIdAuthorKuk, Y-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusSCANNING TUNNELING MICROSCOPE-
dc.subject.keywordPlusCARBON NANOTUBES-
dc.subject.keywordPlusPROJECTION MICROSCOPY-
dc.subject.keywordPlusHOLOGRAPHY-
dc.subject.keywordPlusPLASMONS-
Appears in Collection
CH-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 10 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0