In situ observation of vacancy dynamics during resistance changes of oxide devices

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dc.contributor.authorChoi, Sang-Junko
dc.contributor.authorPark, Gyeong-Suko
dc.contributor.authorKim, Ki-Hongko
dc.contributor.authorYang, Woo-Youngko
dc.contributor.authorBae, Hyung-Jinko
dc.contributor.authorLee, Kyung-Jinko
dc.contributor.authorLee, Hyung-ikko
dc.contributor.authorPark, Seong Yongko
dc.contributor.authorHeo, Sungko
dc.contributor.authorShin, Hyun-Joonko
dc.contributor.authorLee, Sangbinko
dc.contributor.authorCho, Soohaengko
dc.date.accessioned2020-11-23T08:50:06Z-
dc.date.available2020-11-23T08:50:06Z-
dc.date.created2020-11-18-
dc.date.issued2011-09-
dc.identifier.citationJOURNAL OF APPLIED PHYSICS, v.110, no.5-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10203/277505-
dc.description.abstractWe report that the charged oxygen vacancies are the key element to induce a resistive switching in copper oxide resistive devices and an external bias drifts the charged vacancies at the metal/oxide Schottky interface causing the switching phenomenon by in situ transmission electron microscopy. Notable results are that the switching polarity is determined by the charge of the vacancies and that the voltage inducing non-volatile switching behavior originates from the Schottky barrier at the interface, which clarifies the origin of resistive switching and provides a design strategy for oxide resistive devices. (C) 2011 American Institute of Physics. [doi:10.1063/1.3626816]-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.titleIn situ observation of vacancy dynamics during resistance changes of oxide devices-
dc.typeArticle-
dc.identifier.wosid000294968600166-
dc.identifier.scopusid2-s2.0-80052923039-
dc.type.rimsART-
dc.citation.volume110-
dc.citation.issue5-
dc.citation.publicationnameJOURNAL OF APPLIED PHYSICS-
dc.identifier.doi10.1063/1.3626816-
dc.contributor.localauthorLee, Kyung-Jin-
dc.contributor.nonIdAuthorChoi, Sang-Jun-
dc.contributor.nonIdAuthorPark, Gyeong-Su-
dc.contributor.nonIdAuthorKim, Ki-Hong-
dc.contributor.nonIdAuthorYang, Woo-Young-
dc.contributor.nonIdAuthorBae, Hyung-Jin-
dc.contributor.nonIdAuthorLee, Hyung-ik-
dc.contributor.nonIdAuthorPark, Seong Yong-
dc.contributor.nonIdAuthorHeo, Sung-
dc.contributor.nonIdAuthorShin, Hyun-Joon-
dc.contributor.nonIdAuthorLee, Sangbin-
dc.contributor.nonIdAuthorCho, Soohaeng-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusSRTIO3-
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