A study of failure criteria for a crack in multilayer ceramic capacitors by ball drop test

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dc.contributor.authorEom, Soo-Hyunko
dc.contributor.authorLee, Jung-Ryulko
dc.contributor.authorSON, DAE SUNGko
dc.contributor.authorPark, Chun Myungko
dc.contributor.authorLim, Jae Hoonko
dc.contributor.authorKim, Seong Jinko
dc.contributor.authorPark, Chang Kyuko
dc.date.accessioned2020-07-07T02:20:25Z-
dc.date.available2020-07-07T02:20:25Z-
dc.date.created2020-07-03-
dc.date.created2020-07-03-
dc.date.issued2020-04-24-
dc.identifier.citationActive and Passive Smart Structures and Integrated Systems 2020-
dc.identifier.urihttp://hdl.handle.net/10203/275299-
dc.description.abstractMeasuring with strain gages has a limitation of consuming time to prepare for the experiment and attaching near the MLCCs, making it does not represent the physical quantities of the MLCCs itself. In this study, we propose a ‘failure criteria for a crack in MLCCs soldered on a Print-Circuit-Board by ball drop test’ based on the acceleration measured by Laser Doppler Vibrometers. By drawing a Shock Response Spectrum, we can find the dominant frequency for the failure of MLCCs. In addition, we present a suitable deformation form of the Print-Circuit-Board by using a high-speed camera.-
dc.languageEnglish-
dc.publisherThe international society for optics and photonics-
dc.titleA study of failure criteria for a crack in multilayer ceramic capacitors by ball drop test-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameActive and Passive Smart Structures and Integrated Systems 2020-
dc.identifier.conferencecountryUS-
dc.identifier.doi10.1117/12.2558351-
dc.contributor.localauthorLee, Jung-Ryul-
dc.contributor.nonIdAuthorEom, Soo-Hyun-
dc.contributor.nonIdAuthorPark, Chun Myung-
dc.contributor.nonIdAuthorLim, Jae Hoon-
dc.contributor.nonIdAuthorKim, Seong Jin-
dc.contributor.nonIdAuthorPark, Chang Kyu-
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AE-Conference Papers(학술회의논문)
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