DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Jinwoo | ko |
dc.contributor.author | Choi, Jindoo | ko |
dc.contributor.author | Kim, Soohyun | ko |
dc.date.accessioned | 2020-04-09T08:20:06Z | - |
dc.date.available | 2020-04-09T08:20:06Z | - |
dc.date.created | 2020-04-08 | - |
dc.date.created | 2020-04-08 | - |
dc.date.created | 2020-04-08 | - |
dc.date.issued | 2020-05 | - |
dc.identifier.citation | OPTICS COMMUNICATIONS, v.462 | - |
dc.identifier.issn | 0030-4018 | - |
dc.identifier.uri | http://hdl.handle.net/10203/273855 | - |
dc.description.abstract | Terahertz (THz) radiation suffers severe signal loss due to the high absorptivity of water vapor abundant in normal atmosphere, greatly limiting its potential in noninvasive material characterization. We propose a novel THz signal processing method that enables effective extraction of hidden sample information leading to accurate thickness determination. The thicknesses of multiple silicon wafers are measured using only a single THz pulse obtained in ambient atmosphere without any prior sample information. The results verify our proposed approach to achieve accurate and precise characterization of materials in a realistic environment. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.title | Accurate thickness measurement using a single terahertz pulse obtained in ambient atmosphere | - |
dc.type | Article | - |
dc.identifier.wosid | 000519848700010 | - |
dc.identifier.scopusid | 2-s2.0-85077924536 | - |
dc.type.rims | ART | - |
dc.citation.volume | 462 | - |
dc.citation.publicationname | OPTICS COMMUNICATIONS | - |
dc.identifier.doi | 10.1016/j.optcom.2020.125276 | - |
dc.contributor.localauthor | Kim, Soohyun | - |
dc.contributor.nonIdAuthor | Choi, Jindoo | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Thickness measurement | - |
dc.subject.keywordAuthor | Material characterization | - |
dc.subject.keywordAuthor | Noninvasive inspection | - |
dc.subject.keywordAuthor | Terahertz time-domain spectroscopy | - |
dc.subject.keywordPlus | TIME-DOMAIN SPECTROSCOPY | - |
dc.subject.keywordPlus | EXPLOSIVES | - |
dc.subject.keywordPlus | ABSORPTION | - |
dc.subject.keywordPlus | INDEX | - |
dc.subject.keywordPlus | FILMS | - |
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