A PVT-robust -59-dBc reference spur and 450-fsRMS jitter injection-locked clock multiplier using a voltage-domain period-calibrating loop

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dc.contributor.authorLee, Yongsunko
dc.contributor.authorYoon, Heeinko
dc.contributor.authorKim, Minako
dc.contributor.authorChoi, Jaehyoukko
dc.date.accessioned2019-12-13T13:26:35Z-
dc.date.available2019-12-13T13:26:35Z-
dc.date.created2019-11-19-
dc.date.created2019-11-19-
dc.date.issued2016-06-15-
dc.identifier.citation30th IEEE Symposium on VLSI Circuits, VLSI Circuits 2016-
dc.identifier.urihttp://hdl.handle.net/10203/269642-
dc.description.abstractThis paper presents a low-reference-spur and low-jitter injection-locked clock multiplier (ILCM). To secure these performances over PVT-variations, we propose the use of a voltage-domain period-calibrating loop (VDPCL) in the ILCM that monitors the intrinsic period of the VCO and stores this information as the charges in a capacitor. By evaluating the voltage of the capacitor, it is possible to correct the free-running frequency of the VCO. By iteratively accumulating charges, the precision of the calibration can be increased. The measured reference spur and RMS jitter were -59 dBc and 450 fs, respectively, and their degradations over the PVT were less than 1.5 dB and 50 fs, respectively.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleA PVT-robust -59-dBc reference spur and 450-fsRMS jitter injection-locked clock multiplier using a voltage-domain period-calibrating loop-
dc.typeConference-
dc.identifier.scopusid2-s2.0-84990943383-
dc.type.rimsCONF-
dc.citation.publicationname30th IEEE Symposium on VLSI Circuits, VLSI Circuits 2016-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationHonolulu, HI-
dc.identifier.doi10.1109/VLSIC.2016.7573550-
dc.contributor.localauthorChoi, Jaehyouk-
dc.contributor.nonIdAuthorLee, Yongsun-
dc.contributor.nonIdAuthorYoon, Heein-
dc.contributor.nonIdAuthorKim, Mina-
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EE-Conference Papers(학술회의논문)
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