Exploiting data longevity for enhancing the lifetime of flash-based storage class memory

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dc.contributor.authorChoi, Wonilko
dc.contributor.authorArjomand, Mohammadko
dc.contributor.authorJung, Myoungsooko
dc.contributor.authorKandemir, Mahmut T.ko
dc.date.accessioned2019-12-13T12:31:18Z-
dc.date.available2019-12-13T12:31:18Z-
dc.date.created2019-11-28-
dc.date.issued2017-06-05-
dc.identifier.citation2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2017, pp.53-
dc.identifier.urihttp://hdl.handle.net/10203/269616-
dc.description.abstractThis paper proposes to exploit the capability of retention time relaxation in flash memories for improving the lifetime of an SLCbased SSD. The main idea is that as a majority of I/O data in a typical workload do not need a retention time larger than a few days, we can have multiple partial program states in a cell and use every two states to store one-bit data at each time. Thus, we can store multiple bits in a cell (one bit at each time) without erasing it after each write -That would directly translates into lifetime enhancement. The proposed scheme is called Dense-SLC (D-SLC) flash design which improves SSD lifetime by 5.1×-8.6×.-
dc.languageEnglish-
dc.publisherACM Special Interest Group on Performance Evaluation (SIGMETRICS)-
dc.titleExploiting data longevity for enhancing the lifetime of flash-based storage class memory-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage53-
dc.citation.publicationname2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2017-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationUrbana-Champaign, IL-
dc.identifier.doi10.1145/3078505.3078527-
dc.contributor.localauthorJung, Myoungsoo-
dc.contributor.nonIdAuthorChoi, Wonil-
dc.contributor.nonIdAuthorArjomand, Mohammad-
dc.contributor.nonIdAuthorKandemir, Mahmut T.-
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