DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoo, Jae-Young | ko |
dc.contributor.author | Seo, Min-Ho | ko |
dc.contributor.author | Lee, Jae Shin | ko |
dc.contributor.author | Choi, Kwang-Wook | ko |
dc.contributor.author | Jo, Min-Seung | ko |
dc.contributor.author | Song, Hyun-Joo | ko |
dc.contributor.author | Yoon, Jun-Bo | ko |
dc.date.accessioned | 2019-12-13T12:27:08Z | - |
dc.date.available | 2019-12-13T12:27:08Z | - |
dc.date.created | 2019-11-30 | - |
dc.date.created | 2019-11-30 | - |
dc.date.issued | 2019-01-29 | - |
dc.identifier.citation | 32nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2019, pp.91 - 94 | - |
dc.identifier.uri | http://hdl.handle.net/10203/269534 | - |
dc.description.abstract | This paper reports a high-sensitivity wearable transparent pressure sensor by maximizing the percolation effect using a sub-100 nm nano-valley. The secret to achieving high sensitivity is to make the nano-valley as narrow as possible to maximize the percolation effect (stress concentration effect). The narrow nano-valley pressure sensor showed a remarkable 400% enhancement in sensitivity compared to a sensor with no nano-valley while maintaining a high transmittance of 83%. This sensitivity value is higher than those of the previous wearable transparent pressure sensors. The fabricated sensor also showed high durability with low variation of 1.2% in repeated pressing of up to 100,000 times under 100 kPa pressure. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Maximizing Percolation Effect Using Sub-100 nm Nano-Valley for High Performance Wearable Transparent Pressure Sensor | - |
dc.type | Conference | - |
dc.identifier.wosid | 000541142100027 | - |
dc.identifier.scopusid | 2-s2.0-85074365961 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 91 | - |
dc.citation.endingpage | 94 | - |
dc.citation.publicationname | 32nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2019 | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Seoul | - |
dc.identifier.doi | 10.1109/MEMSYS.2019.8870688 | - |
dc.contributor.localauthor | Yoon, Jun-Bo | - |
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