A 0.5V-VIN, 0.29ps-Transient-FOM, and Sub-2mV-Accuracy Adaptive-Sampling Digital LDO Using Single-VCO-Based Edge-Racing Time Quantizer

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dc.contributor.authorLee, Jeonghyunko
dc.contributor.authorBang, Jooeunko
dc.contributor.authorLim, Younghyunko
dc.contributor.authorChoi, Jaehyoukko
dc.date.accessioned2019-11-29T06:24:45Z-
dc.date.available2019-11-29T06:24:45Z-
dc.date.created2019-11-19-
dc.date.issued2019-06-12-
dc.identifier.citation33rd Symposium on VLSI Circuits, VLSI Circuits 2019, pp.C130 - C131-
dc.identifier.urihttp://hdl.handle.net/10203/268710-
dc.description.abstractThis work presents a digital LDO using a single-VCO-based edge-racing (SVER) time quantizer to achieve fast transient and high accuracy concurrently. As the SVER scales the sampling frequency dynamically according to the magnitude of the error in the output voltage, the transient response can be improved without the increase in the power consumption in the steady state. Since the SVER uses a single VCO, the accuracy of the output can be high against local mismatches. In measurement, this LDO achieved a 0.29 ps-transient FOM and a sub-2 mV accuracy under 0.5-V supply.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleA 0.5V-VIN, 0.29ps-Transient-FOM, and Sub-2mV-Accuracy Adaptive-Sampling Digital LDO Using Single-VCO-Based Edge-Racing Time Quantizer-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpageC130-
dc.citation.endingpageC131-
dc.citation.publicationname33rd Symposium on VLSI Circuits, VLSI Circuits 2019-
dc.identifier.conferencecountryJA-
dc.identifier.conferencelocationKyoto-
dc.identifier.doi10.23919/VLSIC.2019.8777999-
dc.contributor.nonIdAuthorLee, Jeonghyun-
dc.contributor.nonIdAuthorBang, Jooeun-
dc.contributor.nonIdAuthorLim, Younghyun-
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