Quantum transport simulations of the zero temperature coefficient in gate-All-Around nanowire pfets

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dc.contributor.authorLee, Hyeonguko
dc.contributor.authorShin, Mincheolko
dc.contributor.authorSeo, Junbeomko
dc.date.accessioned2019-11-26T03:21:05Z-
dc.date.available2019-11-26T03:21:05Z-
dc.date.created2019-11-26-
dc.date.created2019-11-26-
dc.date.created2019-11-26-
dc.date.created2019-11-26-
dc.date.issued2019-09-04-
dc.identifier.citation24th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp.117 - 120-
dc.identifier.issn1946-1569-
dc.identifier.urihttp://hdl.handle.net/10203/268586-
dc.description.abstractWe present a full quantum transport study of the zero-temperature coefficient (ZTC) point for sub-10 nm gateall-around nanowire p-type field effect transistors (GAA NW pFETs). The phonon scattering effects are included through the self-consistent Born approximation in the non-equilibrium Green's function framework. The main findings are that the ZTC point can be present in GAA NW pFETs in sub-10 nm regime and the gate voltage at the ZTC point shows an opposite trend and has an upper limit at a certain gate length. This is due to the interplay between the ballisticity ratio and the ballistic current ratio, which can be explained only by the quantum transport simulations.-
dc.languageEnglish-
dc.publisherAtomera,et al.,GTS,Infineon,Leti - Cea Tech,Samsung-
dc.titleQuantum transport simulations of the zero temperature coefficient in gate-All-Around nanowire pfets-
dc.typeConference-
dc.identifier.wosid000651583400029-
dc.identifier.scopusid2-s2.0-85074336457-
dc.type.rimsCONF-
dc.citation.beginningpage117-
dc.citation.endingpage120-
dc.citation.publicationname24th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)-
dc.identifier.conferencecountryIT-
dc.identifier.conferencelocationPalazzo di Toppo Wassermann, Udine-
dc.identifier.doi10.1109/SISPAD.2019.8870416-
dc.contributor.localauthorShin, Mincheol-
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EE-Conference Papers(학술회의논문)
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