Analysis of nanoparticles by atom probe tomography3차원 원자단위 정량 분석 기술 개발

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We present a new method of preparing needle-shaped specimens for atom probe tomography from freestanding Pd and C-supported Pt nanoparticles. The method consists of two steps, namely electrophoresis of nanoparticles on a flat Cu substrate followed by electrodeposition of a Ni film acting as an embedding matrix for the nanoparticles. Atom probe specimen preparation can be subsequently carried out by means of focused-ion-beam milling. Using this approach, we have been able to perform a correlative atom probe tomography and transmission electron microscopy analyses on both nanoparticle systems. Reliable mass spectra and three- dimensional atom maps could be in particular obtained for Pd nanoparticle specimens. In contrast, atom probe samples prepared from C-supported Pt nanoparticles showed uneven field evaporation and hence artifacts in the reconstructed atom maps. Our developed method can provide a viable means of mapping the three-dimensional atomic distribution within nanoparticles and is expected to contribute to an improved understanding of the structure-composition-property relationships of various nanoparticle systems.
Advisors
Choi, Pyuck-Paresearcher최벽파researcher
Description
한국과학기술원 :신소재공학과,
Publisher
한국과학기술원
Issue Date
2018
Identifier
325007
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2018.8,[iii, 45 p. :]

Keywords

Atom Probe Tomography▼ametallic nanoparticles▼aelectrophoresis▼aelectroplating▼aatomic resolution; 3차원 원자단위 분석▼a금속 나노입자▼a전기영동▼a전기도금▼a원자분해능

URI
http://hdl.handle.net/10203/266522
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=828534&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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