Six-degree-of-freedom displacement measurement system using a diffraction grating

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dc.contributor.authorKim, JAko
dc.contributor.authorKim, KCko
dc.contributor.authorBae, EWko
dc.contributor.authorKim, Soohyunko
dc.contributor.authorKwak, Yoon Keunko
dc.date.accessioned2008-01-08T06:06:58Z-
dc.date.available2008-01-08T06:06:58Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-08-
dc.identifier.citationREVIEW OF SCIENTIFIC INSTRUMENTS, v.71, no.8, pp.3214 - 3219-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/10203/2654-
dc.description.abstractSix-degree-of-freedom displacement measurement systems are applicable in many fields: precision machine control, precision assembly, vibration analysis, and so on. This article presents a new six-degree-of-freedom displacement measurement system utilizing typical features of a diffraction grating. It is composed of a laser source, three position sensitive detectors, a diffraction grating target, and several optical components. Six-degree-of-freedom displacement is calculated from the coordinates of diffracted rays on the detectors. A forward and an inverse problem were solved to compute the full pose of an object through kinematic analysis. The experimental results show that the measurement system had a maximum error of +/- 10 mu m for translation and +/- 0.012 degrees for rotation. The repeatability is about 10 mu m for translation and 0.01 degrees for rotation. (C) 2000 American Institute of Physics. [S0034-6748(00)04708-0].-
dc.description.sponsorshipThis work was supported in part by the Brain Korea 21 Project.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherAMER INST PHYSICS-
dc.subjectSENSOR-
dc.titleSix-degree-of-freedom displacement measurement system using a diffraction grating-
dc.typeArticle-
dc.identifier.wosid000088787200044-
dc.identifier.scopusid2-s2.0-0001107828-
dc.type.rimsART-
dc.citation.volume71-
dc.citation.issue8-
dc.citation.beginningpage3214-
dc.citation.endingpage3219-
dc.citation.publicationnameREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Soohyun-
dc.contributor.localauthorKwak, Yoon Keun-
dc.contributor.nonIdAuthorKim, JA-
dc.contributor.nonIdAuthorKim, KC-
dc.contributor.nonIdAuthorBae, EW-
dc.type.journalArticleArticle-
dc.subject.keywordPlusSENSOR-
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