Germanium-on-Nothing for Epitaxial Liftoff of GaAs Solar Cells

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dc.contributor.authorPark, Sanghyunko
dc.contributor.authorSimon, Johnko
dc.contributor.authorSchulte, Kevin L.ko
dc.contributor.authorPtak, Aaron J.ko
dc.contributor.authorWi, Jung-Subko
dc.contributor.authorYoung, David L.ko
dc.contributor.authorOh, Jihunko
dc.date.accessioned2019-08-05T05:20:36Z-
dc.date.available2019-08-05T05:20:36Z-
dc.date.created2019-08-05-
dc.date.created2019-08-05-
dc.date.created2019-08-05-
dc.date.issued2019-07-
dc.identifier.citationJoule, v.3, no.7, pp.1782 - 1793-
dc.identifier.issn2542-4351-
dc.identifier.urihttp://hdl.handle.net/10203/263975-
dc.description.abstractSolar cells from III-V materials offer outstanding light conversion efficiency and power densities and have a proven reliability record. Nevertheless, the utilization of III-V devices has been hindered by high production costs that partially stem from expensive substrates for the growth of III-V materials. Here, we present an ultrathin epitaxially ready single-crystal Ge membrane, formed by germanium-on-nothing (GON) technology, which employs morphological evolution of an arrayed porous Ge during hydrogen annealing. This new process, inspired by a silicon-on-nothing (SON) process, significantly improves the reformed Ge surface compared with previous porous Ge studies such that low-defect-density heteroepitaxy of GaAs is achievable. We demonstrated the growth of a 14.44% efficient GaAs solar cell on GON with nearly identical open circuit voltage to a control cell grown on a bulk Ge and successfully transferred it onto an inexpensive handle by employing the plate-like void under the Ge film as a release layer.-
dc.languageEnglish-
dc.publisherCELL PRESS-
dc.titleGermanium-on-Nothing for Epitaxial Liftoff of GaAs Solar Cells-
dc.typeArticle-
dc.identifier.wosid000476463300018-
dc.identifier.scopusid2-s2.0-85068693737-
dc.type.rimsART-
dc.citation.volume3-
dc.citation.issue7-
dc.citation.beginningpage1782-
dc.citation.endingpage1793-
dc.citation.publicationnameJoule-
dc.identifier.doi10.1016/j.joule.2019.05.013-
dc.contributor.localauthorOh, Jihun-
dc.contributor.nonIdAuthorPark, Sanghyun-
dc.contributor.nonIdAuthorSimon, John-
dc.contributor.nonIdAuthorSchulte, Kevin L.-
dc.contributor.nonIdAuthorPtak, Aaron J.-
dc.contributor.nonIdAuthorWi, Jung-Sub-
dc.contributor.nonIdAuthorYoung, David L.-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusTHIN-FILM-
dc.subject.keywordPlusHIGH-EFFICIENCY-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusINTERFACE-
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