A study on the resistivity and mechanical properties of modified nano-Ag coated Cu particles in electrically conductive adhesives

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dc.contributor.authorZhang, Shuyeko
dc.contributor.authorQi, Xiaoquanko
dc.contributor.authorYang, Mingko
dc.contributor.authorCao, Yangko
dc.contributor.authorLin, Tiesongko
dc.contributor.authorHe, Pengko
dc.contributor.authorPaik, Kyung-Wookko
dc.date.accessioned2019-06-12T07:50:02Z-
dc.date.available2019-06-12T07:50:02Z-
dc.date.created2019-06-12-
dc.date.issued2019-05-
dc.identifier.citationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.30, no.10, pp.9171 - 9183-
dc.identifier.issn0957-4522-
dc.identifier.urihttp://hdl.handle.net/10203/262574-
dc.description.abstractElectrically conductive adhesives (ECAs) are mainly used in IC packaging, LED packaging and other electronic industry to replace the traditional soldering and lead-free solders, therefore, there is a constant need to improve the electrical conductive and mechanical property of ECAs. In this study, the electrical resistivity and shear strength of the modified nano-Ag coated Cu particles in ECA was investigated and compromised, in terms of filler contents, curing temperature and curing time. The conductive mechanism of the modified nano-Ag coated Cu particles in ECA was discussed as the filler content increased. Finally, the filler content was optimized by 23.5 vol% and 170 degrees C 100min curing condition was selected to obtain the compromised property (5.159x10(-6) cm 6.121MPa), which is better than the previous one (4.99x10(-6) cm, 4.406MPa) at 200 degrees C. The tested data, as well as the failure mode and fracture interfaces, were carried out in this study.-
dc.languageEnglish-
dc.publisherSPRINGER-
dc.titleA study on the resistivity and mechanical properties of modified nano-Ag coated Cu particles in electrically conductive adhesives-
dc.typeArticle-
dc.identifier.wosid000468437800011-
dc.identifier.scopusid2-s2.0-85066020532-
dc.type.rimsART-
dc.citation.volume30-
dc.citation.issue10-
dc.citation.beginningpage9171-
dc.citation.endingpage9183-
dc.citation.publicationnameJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS-
dc.identifier.doi10.1007/s10854-019-01246-8-
dc.contributor.localauthorPaik, Kyung-Wook-
dc.contributor.nonIdAuthorZhang, Shuye-
dc.contributor.nonIdAuthorQi, Xiaoquan-
dc.contributor.nonIdAuthorYang, Ming-
dc.contributor.nonIdAuthorCao, Yang-
dc.contributor.nonIdAuthorLin, Tiesong-
dc.contributor.nonIdAuthorHe, Peng-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusNANOPARTICLES-
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