High-temperature structure for measuring properties of curved thermoelectric device, and system and method for measuring properties of curved thermoelectric device using the same곡면형 열전 소자의 특성 측정용 고온 구조체, 이를 이용한 특성 측정 시스템 및 방법
Disclosed herein are a high-temperature structure for measuring properties of a curved thermoelectric device, which is capable of precisely measuring the properties of a medium-temperature curved thermoelectric device that is applied to a tube-type waste heat source and is used in research, and a system and a method for measuring the properties using the same. The high-temperature structure may include a plurality of rod-shaped cartridge heaters, and a heating element having a surface that is a curved surface coming into contact with a lower end of the curved thermoelectric device, having a plurality of holes for accommodating the plurality of cartridge heaters, and directly heating the lower end of the curved thermoelectric device.
- Country
- US (United States)
- Issue Date
- 2019-04-02
- Application Date
- 2016-07-26
- Application Number
- 15219429
- Registration Date
- 2019-04-02
- Registration Number
- 10247685
- Appears in Collection
- EE-Patent(특허)
- Files in This Item
- There are no files associated with this item.
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