Breakdown of barkhausen critical scaling behavior with increasing domain wall pinning in fe thin films
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Hun-sung | ko |
| dc.contributor.author | Ryu, Kwang-su | ko |
| dc.contributor.author | You, Chun-yeol | ko |
| dc.contributor.author | Jeon, Kun-rok | ko |
| dc.contributor.author | Parkin, Stuart S. P. | ko |
| dc.contributor.author | Shin, Sung-Chul | ko |
| dc.date.accessioned | 2019-04-16T01:12:02Z | - |
| dc.date.available | 2019-04-16T01:12:02Z | - |
| dc.date.created | 2013-05-28 | - |
| dc.date.issued | 2012-07-13 | - |
| dc.identifier.citation | The 19th International Conference on Magnetism (ICM2012) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/259577 | - |
| dc.language | English | - |
| dc.publisher | International Union of Pure and Applied Physics | - |
| dc.title | Breakdown of barkhausen critical scaling behavior with increasing domain wall pinning in fe thin films | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | The 19th International Conference on Magnetism (ICM2012) | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Busan | - |
| dc.contributor.localauthor | Shin, Sung-Chul | - |
| dc.contributor.nonIdAuthor | Lee, Hun-sung | - |
| dc.contributor.nonIdAuthor | Ryu, Kwang-su | - |
| dc.contributor.nonIdAuthor | You, Chun-yeol | - |
| dc.contributor.nonIdAuthor | Jeon, Kun-rok | - |
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