Design and Characterization of Magnetically Coupled On-Chip Current Probe for Monitoring Switching Current in Chip I/O PDN
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joungho | ko |
| dc.contributor.author | Jonghoon J. Kim | ko |
| dc.contributor.author | Jun So Pak | ko |
| dc.date.accessioned | 2019-04-15T23:52:38Z | - |
| dc.date.available | 2019-04-15T23:52:38Z | - |
| dc.date.created | 2013-06-26 | - |
| dc.date.created | 2013-06-26 | - |
| dc.date.created | 2013-06-26 | - |
| dc.date.issued | 2012-12 | - |
| dc.identifier.citation | 2012 IEEE Electrical Design of Advanced Package & Systems Symposium | - |
| dc.identifier.uri | http://hdl.handle.net/10203/259205 | - |
| dc.language | English | - |
| dc.publisher | EDAPS2012 | - |
| dc.title | Design and Characterization of Magnetically Coupled On-Chip Current Probe for Monitoring Switching Current in Chip I/O PDN | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000317015500063 | - |
| dc.identifier.scopusid | 2-s2.0-84875491868 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 2012 IEEE Electrical Design of Advanced Package & Systems Symposium | - |
| dc.identifier.conferencecountry | CH | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Jonghoon J. Kim | - |
| dc.contributor.nonIdAuthor | Jun So Pak | - |
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