Probing Nanotribological and Electrical Properties of Organic Molecular Films with Atomic Force Microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | PARK, JEONG YOUNG | - |
| dc.contributor.author | QI, AND YABING | - |
| dc.date.accessioned | 2011-12-12T04:18:25Z | - |
| dc.date.available | 2011-12-12T04:18:25Z | - |
| dc.date.issued | 2010 | - |
| dc.identifier.citation | Scanning | en |
| dc.identifier.uri | http://hdl.handle.net/10203/25850 | - |
| dc.language.iso | en_US | en |
| dc.publisher | Fams Inc | en |
| dc.title | Probing Nanotribological and Electrical Properties of Organic Molecular Films with Atomic Force Microscopy | en |
| dc.type | Article | en |
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- EEW-Journal Papers(저널논문)
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