Ge chemical bonding effect on B diffusion in SiGe/SiO2 interface

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dc.contributor.authorLee, Chang Hwiko
dc.contributor.authorOh, Young Junko
dc.contributor.authorKim, Geun-Myeongko
dc.contributor.authorChang, Kee-Jooko
dc.date.accessioned2019-04-15T18:31:05Z-
dc.date.available2019-04-15T18:31:05Z-
dc.date.created2014-01-12-
dc.date.issued2013-10-
dc.identifier.citation16th Asian Workshop on First-Principles Electronic Structure Calculations-
dc.identifier.urihttp://hdl.handle.net/10203/257187-
dc.languageEnglish-
dc.publisherCSRC-
dc.titleGe chemical bonding effect on B diffusion in SiGe/SiO2 interface-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname16th Asian Workshop on First-Principles Electronic Structure Calculations-
dc.identifier.conferencecountryCC-
dc.contributor.localauthorChang, Kee-Joo-
dc.contributor.nonIdAuthorLee, Chang Hwi-
dc.contributor.nonIdAuthorOh, Young Jun-
dc.contributor.nonIdAuthorKim, Geun-Myeong-
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PH-Conference Papers(학술회의논문)
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