Ge chemical bonding effect on B diffusion in SiGe/SiO2 interface
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Chang Hwi | ko |
| dc.contributor.author | Oh, Young Jun | ko |
| dc.contributor.author | Kim, Geun-Myeong | ko |
| dc.contributor.author | Chang, Kee-Joo | ko |
| dc.date.accessioned | 2019-04-15T18:31:05Z | - |
| dc.date.available | 2019-04-15T18:31:05Z | - |
| dc.date.created | 2014-01-12 | - |
| dc.date.issued | 2013-10 | - |
| dc.identifier.citation | 16th Asian Workshop on First-Principles Electronic Structure Calculations | - |
| dc.identifier.uri | http://hdl.handle.net/10203/257187 | - |
| dc.language | English | - |
| dc.publisher | CSRC | - |
| dc.title | Ge chemical bonding effect on B diffusion in SiGe/SiO2 interface | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 16th Asian Workshop on First-Principles Electronic Structure Calculations | - |
| dc.identifier.conferencecountry | CC | - |
| dc.contributor.localauthor | Chang, Kee-Joo | - |
| dc.contributor.nonIdAuthor | Lee, Chang Hwi | - |
| dc.contributor.nonIdAuthor | Oh, Young Jun | - |
| dc.contributor.nonIdAuthor | Kim, Geun-Myeong | - |
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