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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

비과잉성 특징점 추출을 통한 전역 영상 중요도 검출

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이한상 / 김지환 / 김준모researcher
Publisher
대한전자공학회
Issue Date
2014-02-11
Language
Korean
Citation

제26회 영상처리 및 이해에 관한 워크샵

URI
http://hdl.handle.net/10203/255472
Appears in Collection
EE-Conference Papers(학술회의논문)
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