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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoung, MICROELECTRONICS RELIABILITY, v.98, pp.161 - 164, 2019-07 | |
An Efficient Modeling for Underwater Wireless Power Transfer Using Z-Parameters Kim, JongWook; Kim, Kibeom; Kim, Haerim; Kim, Dongwook; Park, Jaehyoung; Ahn, Seungyoung, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.61, no.6, pp.2006 - 2014, 2019-12 |
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