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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Few-shot out-of-distribution detection and classification for mixed-type defect patters = 소량의 학습데이터를 이용한 혼합 결함 패턴 분류 및 분포 외 패턴 탐지link Bak, Jinman; Kim, Heeyoung; 김희영, 한국과학기술원, 2022 |
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