Results 1-1 of 1 (Search time: 0.002 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
---|---|
X-ray meshed tomography for electronic packaging inspection = 전자부품 검사를 위한 X선 격자화 단층 촬영에 관한 연구link Cho, Young-Bin; 조영빈; Gweon, Dae-Gab; 권대갑, 한국과학기술원, 1999 |
Discover