Effect of LaNiO3 top electrode on the resistance of Pb(Zr,Ti)O-3 ferroelectric capacitor to hydrogen damage and fatigue

Cited 20 time in webofscience Cited 0 time in scopus
  • Hit : 237
  • Download : 3
DC FieldValueLanguage
dc.contributor.authorKim, DCko
dc.contributor.authorLee, Won-Jongko
dc.date.accessioned2011-09-15-
dc.date.available2011-09-15-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2002-03-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.3A, pp.1470 - 1476-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/10203/25192-
dc.description.abstractThe polarization hysteresis characteristics of Pb(Zi,Ti)O-3 (PZT) capacitors with a Pt top electrode are degraded by annealing in a hydrogen-containing environment due to the catalytic effect of Pt. This degradation can be avoided by adopting an LaNiO3 (LNO) conductive film as a top electrode. The LNO film does not act as a catalyst for the dissociation of hydrogen molecules and it is also a good diffusion barrier to the hydrogen molecules. The resistance of the LNO film to hydrogen degradation is further enhanced by inserting a thin Pt layer between the LNO and PZT films due to the blocking ability of Pt against the out-diffusion of the Pb component from the PZT film. The polarization characteristics of LNO/Pt/PZT/Pt capacitors are well preserved after hydrogen annealing even at 400degreesC for 30 min. The use of the LNO film as a top electrode also has a significant effect on improving the fatigue property of PZT capacitors.-
dc.description.sponsorshipThis research was supported by the Center for Electronic Packaging Materials of Korea Science and Engineering Foundation.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherINST PURE APPLIED PHYSICS-
dc.subjectTHIN-FILM-
dc.subjectDEGRADATION-
dc.titleEffect of LaNiO3 top electrode on the resistance of Pb(Zr,Ti)O-3 ferroelectric capacitor to hydrogen damage and fatigue-
dc.typeArticle-
dc.identifier.wosid000176451500051-
dc.identifier.scopusid2-s2.0-0036509268-
dc.type.rimsART-
dc.citation.volume41-
dc.citation.issue3A-
dc.citation.beginningpage1470-
dc.citation.endingpage1476-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorLee, Won-Jong-
dc.contributor.nonIdAuthorKim, DC-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorPb(Zr,Ti)O-3-
dc.subject.keywordAuthorLaNiO3-
dc.subject.keywordAuthorhydrogen damage-
dc.subject.keywordAuthorhysteresis characteristics-
dc.subject.keywordAuthorfatigue-
dc.subject.keywordPlusTHIN-FILM-
dc.subject.keywordPlusDEGRADATION-
Appears in Collection
MS-Journal Papers(저널논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 20 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0