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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| A visual shape descriptor using sectors and shape context of contour lines Peng, Shao-Hu; Kim, Deok-Hwan; Lee, Seok-Lyong; Chung, Chin-Wan, INFORMATION SCIENCES, v.180, no.16, pp.2925 - 2939, 2010-08 | |
| An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses Noh, Chung-Ho; Lee, Seok-Lyong; Kim, Deok-Hwan; Chung, Chin-Wan; Kim, Sang-Hee, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.48, no.17, pp.5115 - 5135, 2010 | |
| Distance approximation techniques to reduce the dimensionality for multimedia databases Kim, Yongkwon; Chung, Chin-Wan; Lee, Seok-Lyong; Kim, Deok-Hwan, KNOWLEDGE AND INFORMATION SYSTEMS, v.28, no.1, pp.227 - 248, 2011-07 | |
| An effective defect inspection system for polarized film images using image segmentation and template matching techniques Yoon, Young-Geun; Lee, Seok-Lyong; Chung, Chin-Wan; Kim, Sang-Hee, COMPUTERS & INDUSTRIAL ENGINEERING, v.55, no.3, pp.567 - 583, 2008-10 |
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