Browse "CS-Journal Papers(저널논문)" by Author Yoon, Young-Geun

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An effective defect inspection system for polarized film images using image segmentation and template matching techniques

Yoon, Young-Geun; Lee, Seok-Lyong; Chung, Chin-Wan; Kim, Sang-Hee, COMPUTERS & INDUSTRIAL ENGINEERING, v.55, no.3, pp.567 - 583, 2008-10

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