DSpace at KOASAS
College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Distribution of Trapped Electron and Hole in Thin SiO2 Film

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 292
  • Download : 9
Export
DC FieldValueLanguage
dc.contributor.authorLim, Kyu Nam-
dc.contributor.authorHong, Songcheol-
dc.contributor.authorLee, Kwyro-
dc.date.accessioned2011-08-23T05:24:06Z-
dc.date.available2011-08-23T05:24:06Z-
dc.date.created2012-02-06-
dc.date.issued1996-
dc.identifier.citationInternational Conference on Solid State Devices and Materials, v., no., pp.359 - 361-
dc.identifier.urihttp://hdl.handle.net/10203/24972-
dc.languageENG-
dc.language.isoen_USen
dc.titleDistribution of Trapped Electron and Hole in Thin SiO2 Film-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage359-
dc.citation.endingpage361-
dc.citation.publicationnameInternational Conference on Solid State Devices and Materials-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorHong, Songcheol-
dc.contributor.localauthorLee, Kwyro-
dc.contributor.nonIdAuthorLim, Kyu Nam-
Appears in Collection
EE-Conference Papers(학술회의논문)

Display Simple Item Record

qr_code

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


rss_1.0 rss_2.0 atom_1.0