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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Signal integrity analysis of a super speed pair of a USB 3.0 connector with test Jig

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dc.contributor.authorKim, Jounghoko
dc.contributor.authorKim, Hyesooko
dc.contributor.authorPark, Shinyoungko
dc.contributor.authorKim, Jonghoonko
dc.contributor.authorPark, Jung-Minko
dc.contributor.authorKim, UnHoko
dc.contributor.authorJeon, YuckHwanko
dc.date.accessioned2019-01-22T08:15:39Z-
dc.date.available2019-01-22T08:15:39Z-
dc.date.created2018-12-26-
dc.date.created2018-12-26-
dc.date.created2018-12-26-
dc.date.issued2017-12-15-
dc.identifier.citation2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)-
dc.identifier.urihttp://hdl.handle.net/10203/248944-
dc.languageEnglish-
dc.publisher2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)-
dc.titleSignal integrity analysis of a super speed pair of a USB 3.0 connector with test Jig-
dc.typeConference-
dc.identifier.wosid000428157200128-
dc.identifier.scopusid2-s2.0-85050478429-
dc.type.rimsCONF-
dc.citation.publicationname2017 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)-
dc.identifier.conferencecountryCC-
dc.identifier.conferencelocationHangzhou, China-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorKim, Hyesoo-
dc.contributor.nonIdAuthorPark, Shinyoung-
dc.contributor.nonIdAuthorKim, Jonghoon-
dc.contributor.nonIdAuthorPark, Jung-Min-
dc.contributor.nonIdAuthorKim, UnHo-
dc.contributor.nonIdAuthorJeon, YuckHwan-
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EE-Conference Papers(학술회의논문)
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