Bias-dependent Power Distribution Network Impedance Analysis with MOS Capacitor

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dc.contributor.authorKim, Dong-Hyunko
dc.contributor.authorKim, Subinko
dc.contributor.authorPark, Junyongko
dc.contributor.authorKim, Youngwooko
dc.contributor.authorChoi, Suminko
dc.contributor.authorCho, Kyungjunko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2019-01-22T08:14:49Z-
dc.date.available2019-01-22T08:14:49Z-
dc.date.created2018-12-26-
dc.date.created2018-12-26-
dc.date.created2018-12-26-
dc.date.issued2018-05-16-
dc.identifier.citation2018 Joint Institute of Electrical and Electronics Engineers Eletromagnetic Compatibility (EMC) & Asia-Pacific international symposium on Eletromagnetic Compatibility (APEMC), pp.40 - 40-
dc.identifier.urihttp://hdl.handle.net/10203/248926-
dc.description.abstractBias-dependent power distribution network (PDN) impedance is analyzed with respect to MOS capacitor characteristics. The proposed analysis can be used to improve the PDN impedance of 2.5D and 3D ICs.-
dc.languageEnglish-
dc.publisherIEEE EMC & APEMC-
dc.titleBias-dependent Power Distribution Network Impedance Analysis with MOS Capacitor-
dc.typeConference-
dc.identifier.wosid000439259800020-
dc.identifier.scopusid2-s2.0-85050070361-
dc.type.rimsCONF-
dc.citation.beginningpage40-
dc.citation.endingpage40-
dc.citation.publicationname2018 Joint Institute of Electrical and Electronics Engineers Eletromagnetic Compatibility (EMC) & Asia-Pacific international symposium on Eletromagnetic Compatibility (APEMC)-
dc.identifier.conferencecountrySI-
dc.identifier.conferencelocationSuntec Singapore Convention & Exhibition Centre-
dc.identifier.doi10.1109/ISEMC.2018.8394029-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorKim, Dong-Hyun-
dc.contributor.nonIdAuthorKim, Subin-
dc.contributor.nonIdAuthorPark, Junyong-
dc.contributor.nonIdAuthorKim, Youngwoo-
dc.contributor.nonIdAuthorChoi, Sumin-
dc.contributor.nonIdAuthorCho, Kyungjun-
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