DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Y. | ko |
dc.contributor.author | Kim, Tag-Gon | ko |
dc.date.accessioned | 2011-08-10T04:44:05Z | - |
dc.date.available | 2011-08-10T04:44:05Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997-04-22 | - |
dc.identifier.citation | Enabling Technology for Simulation Science, pp.244 - 255 | - |
dc.identifier.uri | http://hdl.handle.net/10203/24821 | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | SPIE | - |
dc.title | Reusability measure of DEVS simulation models in DEVSim++ environment | - |
dc.type | Conference | - |
dc.identifier.wosid | A1997BJ16T00024 | - |
dc.identifier.scopusid | 2-s2.0-0031289670 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 244 | - |
dc.citation.endingpage | 255 | - |
dc.citation.publicationname | Enabling Technology for Simulation Science | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Orlando, FL | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Tag-Gon | - |
dc.contributor.nonIdAuthor | Choi, Y. | - |
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