High-Resolving-Power Long-Working-Distance Holographic Microscopy Using a Scattering Layer
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Baek, Yoonseok | ko |
| dc.contributor.author | Park, Yong Keun | ko |
| dc.date.accessioned | 2018-07-24T02:31:06Z | - |
| dc.date.available | 2018-07-24T02:31:06Z | - |
| dc.date.created | 2018-07-10 | - |
| dc.date.issued | 2018-03-27 | - |
| dc.identifier.citation | Focus on Microscopy 2018 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/244177 | - |
| dc.language | English | - |
| dc.publisher | AMC Congress Organisation | - |
| dc.title | High-Resolving-Power Long-Working-Distance Holographic Microscopy Using a Scattering Layer | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Focus on Microscopy 2018 | - |
| dc.identifier.conferencecountry | SI | - |
| dc.identifier.conferencelocation | Singapore Expo Convention & Exhibition centre | - |
| dc.contributor.localauthor | Park, Yong Keun | - |
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