Scanning Parameter Optimization for Inspectation of Wedling Defects in X-ray Linear Laminography
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Miran | ko |
| dc.contributor.author | Lee, Minju | ko |
| dc.contributor.author | Kim, Giyoon | ko |
| dc.contributor.author | Hwang, Sun-Uk | ko |
| dc.contributor.author | Kim, Hyean Dock | ko |
| dc.contributor.author | Cho, Seungryong | ko |
| dc.contributor.author | Cho, Gyuseong | ko |
| dc.date.accessioned | 2018-07-24T01:44:24Z | - |
| dc.date.available | 2018-07-24T01:44:24Z | - |
| dc.date.created | 2018-06-28 | - |
| dc.date.issued | 2017-08-01 | - |
| dc.identifier.citation | International confernece on Thermoelectrics (ICT) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/243783 | - |
| dc.language | English | - |
| dc.publisher | International confernece on Thermoelectrics (ICT) | - |
| dc.title | Scanning Parameter Optimization for Inspectation of Wedling Defects in X-ray Linear Laminography | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International confernece on Thermoelectrics (ICT) | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Pasadena, California | - |
| dc.contributor.localauthor | Cho, Seungryong | - |
| dc.contributor.localauthor | Cho, Gyuseong | - |
| dc.contributor.nonIdAuthor | Hwang, Sun-Uk | - |
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