Precise and robust hall effect gap sensor with common electrical and magnetic noise reduction technique
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cho, Gyu-Hyeong | ko |
| dc.contributor.author | Park, Sanghui | ko |
| dc.date.accessioned | 2018-07-24T01:44:07Z | - |
| dc.date.available | 2018-07-24T01:44:07Z | - |
| dc.date.created | 2018-06-29 | - |
| dc.date.created | 2018-06-29 | - |
| dc.date.created | 2018-06-29 | - |
| dc.date.issued | 2017-10-18 | - |
| dc.identifier.citation | 2017 IEEE Electron Devices and Solid-State Circuits, EDSSC 2017 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/243778 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Precise and robust hall effect gap sensor with common electrical and magnetic noise reduction technique | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000426985900031 | - |
| dc.identifier.scopusid | 2-s2.0-85043574977 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 2017 IEEE Electron Devices and Solid-State Circuits, EDSSC 2017 | - |
| dc.identifier.conferencecountry | CH | - |
| dc.identifier.conferencelocation | Hsinchu | - |
| dc.contributor.localauthor | Cho, Gyu-Hyeong | - |
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