Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering

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We present a method to measure the vector-field light scattering of individual microscopic objects. The polarization-dependent optical field images are measured with quantitative phase imaging at the sample plane, and then numerically propagated to the far-field plane. This approach allows the two-dimensional polarization-dependent angle-resolved light scattered patterns from individual object to be obtained with high precision and sensitivity. Using this method, we present the measurements of the polarization-dependent light scattering of a liquid crystal droplet and individual silver nanowires over scattering angles of 50 degrees. In addition, the spectroscopic extension of the polarization-dependent angle-resolved light scattering is demonstrated using wavelength-scanning illumination. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Publisher
OPTICAL SOC AMER
Issue Date
2018-03
Language
English
Article Type
Article
Keywords

DIGITAL HOLOGRAPHIC MICROSCOPY; JONES MATRIX; FLUORESCENCE MICROSCOPY; SENSITIVE MATERIALS; DIFFRACTION PHASE; CELL; SPECTROSCOPY; DISEASE; TOMOGRAPHY; CRYSTALS

Citation

OPTICS EXPRESS, v.26, no.6, pp.7701 - 7711

ISSN
1094-4087
DOI
10.1364/OE.26.007701
URI
http://hdl.handle.net/10203/241331
Appears in Collection
PH-Journal Papers(저널논문)
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